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Link: http://dx.doi.org/10.21079/11681/47403
Report Number: ERDC/CHL CHETN-IX-65
Title: Sensitivity of Simulated Flaw-Height Estimates to Phased Array Scan Parameters
By: Jason D. Ray, James S. Kinnebrew, Ramsay D. Bell, and Martin T. Schultz
Approved for public release; distribution is unlimited.
August 2023
17 pages / 2.6 Mb
Release no. 23-081