PUBLICATION NOTICE: Determination of nanomaterials’ film thickness using filmetrics F40-UV thin-film analyzer; Standard Operating Procedure Series : Characterization (C)

The US Army Engineer Research and Development Center has published the report/note described and linked below. Approved for public release; distribution is unlimited.

Report Number:

ERDC/EL CR-19-1

Title:

Determination of Nanomaterials' Film Thickness Using Filmetrics F40-UV Thin-Film Analyzer; Standard Operating Procedure Series : Characterization (C)

Author(s):

Qihua Wu, Kathryn Kremer, and Stephen Gibbons

Purpose/Abstract:

Optical measurement techniques have been widely used for the determination of thin film thicknesses and optical constants. This standard operating procedure (SOP) presents a specific protocol for the determination of nanomaterial thin-film thicknesses and their optical constants - including the refractive index (RI) and the extinction coefficient - using a Filmetrics F40-UV Thin Film Analyzer. Procedures and recommendations of instrument preparation and parameters, sample measurement, and results analysis are included. The procedure applies to a wide range of nanomaterial thin films in the thickness range from approximately 4 nm to 25 μm.

19 pgs / 1.2 mb

CLASSIFICATION: UNCLASSIFIED

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